Quantification of phase content in TiO2 thin films by Raman spectroscopy. Superficies y Vacío, [S. l.], v. 27, n. 3, p. 88–92, 2014. Disponível em: https://www.superficiesyvacio.smctsm.org.mx/index.php/SyV/article/view/141. Acesso em: 5 feb. 2026.